Colour enhanced x-ray diffraction pattern from a silicon integrated circuit wafer. Pattern shows the 3-fold rotational symmetry of the crystal lattice. X-ray diffraction is a technique in crystallography used to find the shape or structure of a molecule | |
Lizenzart: | Lizenzpflichtig |
Credit: | Science Photo Library / Falco, Charles |
Bildgröße: | 3951 px × 2947 px |
Modell-Rechte: | nicht erforderlich |
Eigentums-Rechte: | nicht erforderlich |
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